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Pellicle factors affecting finished photomask flatness

机译:影响最终光掩模平整度的薄膜因素

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Previous work has shown that photomask blank flatness as well as photomask patterning and pelliclization all play an important role in finished photomask flatness. Other work has shown that pellicle mounting techniques and pellicle adhesives play a role as well. In this work, a comparison of the impact of various pellicle types, frame flatness, frame shape and pellicle mounting tools on final photomask flatness will be shown. Pellicles with various adhesives, frame shapes and flatness were mounted on blanks and completed photomasks using several mounting tools and the pellicle induced flatness change was measured. These data will be discussed with the objective of demonstrating the effects of pellicle type and mounting tool on photomask flatness.
机译:先前的工作表明,光掩模坯料的平整度以及光掩模的图案化和拼粒化都对最终的光掩模平整度起着重要作用。其他工作表明,防护膜安装技术和防护膜粘合剂也发挥了作用。在这项工作中,将显示各种防护膜类型,框架平坦度,框架形状和防护膜安装工具对最终光掩模平坦度的影响的比较。将具有各种粘合剂,框架形状和平坦度的薄膜安装在毛坯上,并使用几种安装工具将其制成完整的光掩模,并测量薄膜引发的平坦度变化。将讨论这些数据,以证明防护膜类型和安装工具对光掩模平坦度的影响。

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