Multiple beam ptychography for large field of view imaging

摘要

We present an extension of ptychography coherent diffractive imaging that enables simultaneous imaging of several areas of an extended sample using multiple, spatially separated interfering beams. We show that this technique will increase the throughput of an imaging system by a factor that is equal to the number of beams used. This allows for the acquisition of large field of view images with near diffraction-limited resolution without an increase in data acquisition. This represents a significant step towards large field of view, high resolution imaging in the EUV and x-ray energy regimes.