首页> 外文会议>Nineteenth International VLSI Multilevel Interconnection Conference (VMIC) Nov 19-20, 2002 Singapore >A DEVELOPMENT OF SUPER HIGH-PRESSURE MIC RO JET SYSTEM FOR PAD DRESSING AND POST-CMP CLEANING IN CMP PROCESS
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A DEVELOPMENT OF SUPER HIGH-PRESSURE MIC RO JET SYSTEM FOR PAD DRESSING AND POST-CMP CLEANING IN CMP PROCESS

机译:CMP过程中用于垫料清理和CMP后清洁的超高压MICRO JET系统的开发

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This paper describes about design ways of the super high-pressure micro jet system using CMP process. The super high-pressure micro jet system that jets out micro de-ionized water, function water and chemical liquid with the pressure from 3MPa to 30Mpa and is used for pad dressing and cleaning wafer of post CMP. This pad dressing technique using the super high pressure micro jet system has the feature of effective recovering the choked surface of the polishing pad surface effectively without wear-out of the pad. And the super high-pressure micro jet system is the more efficient cleaning method than a conventional method and it adopts single-substrate cleaning process. As the super high-pressure micro jet system jets out microns droplets forward to cleaning object with high speed from a special nozzle, it has high cleaning ability. Therefore we must grasp the most suitable particle diameter and particle speed, so we try to measure them and design the system on the most suitable condition. Various experiments to confirm of pad dressing effect using super high-pressure micro jet method are made by us.
机译:本文介绍了采用CMP工艺的超高压微射流系统的设计方法。超高压微喷射系统,可喷射压力为3MPa至30Mpa的微去离子水,功能水和化学液体,用于CMP后的晶片修整和清洁。使用超高压微喷射系统的该垫修整技术具有有效地恢复抛光垫表面的the塞表面而不会磨损垫的特征。而且超高压微喷射系统是比常规方法更有效的清洁方法,并且它采用单基材清洁工艺。超高压微喷射系统通过特殊喷嘴将微米级的液滴高速喷射到清洁物体上,因此具有很高的清洁能力。因此,我们必须掌握最合适的粒径和速度,以便尝试对其进行测量,并在最合适的条件下设计系统。我们进行了各种实验,以证实使用超高压微射流方法进行的垫层修整效果。

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