首页> 外文会议>Nanotechnology Materials and Devices Conference, 2006 IEEE >Near-field measurement of quantum dot broad area laser diodes by utilizing near-field scanning optical microscope: Effects of the linewidth enhancement factor on filamentation

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Near-field measurement of quantum dot broad area laser diodes by utilizing near-field scanning optical microscope: Effects of the linewidth enhancement factor on filamentation

机译：利用近场扫描光学显微镜对量子点广域激光二极管进行近场测量：线宽增强因子对细丝化的影响

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Near-field scanning optical microscopy (NSOM) studies of road area laser diodes (BALD) with different structures of quantum dot (QD) and quantum well (QW) were performed. The values of plusmn-factor for the two types of BALD were measured as 0.6 (QD) and

机译：对具有不同量子点（QD）和量子阱（QW）结构的道路区域激光二极管（BALD）进行了近场扫描光学显微镜（NSOM）研究。两种类型的BALD的正值系数值分别为0.6（QD）和

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来源
《Nanotechnology Materials and Devices Conference, 2006 IEEE》|2006年|P.410-411|共2页
会议地点 GyeongjuKorea (South)
作者
Jung; S.I.; Yeo; H.Y.; Yeo Yun; Han; K.;
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optical microscopy; quantum dots; quantum wells; semiconductor lasers; broad area laser diodes; filamentation; linewidth enhancement factor; near-field measurement; near-field scanning optical microscopy; quantum dot; quantum well; broad area laser diode; near-field;

机译：光学显微镜量子点;量子阱半导体激光器；广域激光二极管；细丝线宽增强因子；近场测量近场扫描光学显微镜量子点量子阱广域激光二极管近场;

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专利

1. Near-field scanning optical microscopy of quantum dot broad area laser diodes [J] . S. I. Jung, H. Y. Yeo, I. Yun, Journal of materials science . 2007,第S1期

机译：量子点广域激光二极管的近场扫描光学显微镜
2. Homogeneous linewidth broadening in a In0.5Ga0.5As/GaAs single quantum dot at room temperature investigated using a highly sensitive near-field scanning optical microscope [J] . Matsuda K, Ikeda K, Saiki T, Physical Review, B. Condensed Matter . 2001,第12期

机译：使用高灵敏度的近场扫描光学显微镜研究了In0.5Ga0.5As / GaAs单量子点在室温下的同质线宽展宽
3. Optical Characteristics and the Linewidth Enhancement Factor Measured from InAs/GaAs Quantum Dot Laser Diodes [J] . Kyoung Chan Kim, Il Ki Han, Young Chae Yoo, IEEE transactions on nanotechnology . 2008,第2期

机译：从InAs / GaAs量子点激光二极管测量的光学特性和线宽增强因子
4. Near-field measurement of quantum dot broad area laser diodes by utilizing near-field scanning optical microscope: Effects of the linewidth enhancement factor on filamentation [C] . S. I. Jung, H. Y. Yeo, I. Yun, IEEE Nanotechnology Materials and Devices Conference . 2006

机译：利用近场扫描光学显微镜，近场扫描光学显微镜近场测量量子点宽面积激光二极管：线宽增强因子对丝丝的影响
5. The design of a novel tip enhanced near-field scanning probe microscope for ultra-high resolution optical imaging. [D] . Nowak, Derek Brant. 2010

机译：一种用于超高分辨率光学成像的新型尖端增强型近场扫描探针显微镜的设计。
6. Quantum Dots for Multiplexed Detection and Characterisation of Prostate Cancer Cells Using a Scanning Near-Field Optical Microscope [O] . Kelly-Ann D. Walker, Claire Morgan, Shareen H. Doak, -1

机译：量子点用于使用扫描近场光学显微镜前列腺癌细胞的多重检测和表征
7. Quantum Dots for Multiplexed Detection and Characterisation of Prostate Cancer Cells Using a Scanning Near-Field Optical Microscope [O] . Walker, Kelly-Ann D., Morgan, Claire, Doak, Shareen H., 2012

机译：使用扫描近场光学显微镜对前列腺癌细胞进行多重检测和表征的量子点
8. Near-Field Scanning Optical Microscope/Atomic Force Microscope with Broad-Band Source for Study of Optical Metamaterials and Nanocircuits. [R] . Engheta, N., Drndic, M., Edwards, B. 2011

机译：具有宽带光源的近场扫描光学显微镜/原子力显微镜，用于研究光学材料和纳米电路。

Near-field measurement of quantum dot broad area laser diodes by utilizing near-field scanning optical microscope: Effects of the linewidth enhancement factor on filamentation

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