Institute of Physics of the ASCR, v.v.i., Na Slovance 2, 182 21, Prague, Czech Republic;
rnInstitute of Physics of the ASCR, v.v.i., Na Slovance 2, 182 21, Prague, Czech Republic;
rnInstitute of Physics of the ASCR, v.v.i., Na Slovance 2, 182 21, Prague, Czech Republic;
rnInstitute of Physics of the ASCR, v.v.i., Na Slovance 2, 182 21, Prague, Czech Republic;
rnInstitute of Physics of the ASCR, v.v.i., Na Slovance 2, 182 21, Prague, Czech Republic;
rnDepartment of Physical Electronics, Faculty of Nuclear Sciences and Physical Engineering, CzechrnTechnical University in Prague, V Holesovickach 2, 180 00 Prague 8, Czech Republic;
aluminium ultra thin film; magnetron sputtering; in-situ monitoring; electrical conductivity; spectral ellipsometry; optical emission spectroscopy; mass spectroscopy;
机译:Cu_2Fesns _4球形纳米结构薄膜的线性和非线性光学行为的制造和生长
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机译:薄膜生长机制对通过过滤的阴极真空弧沉积铝薄膜镜面反射率的影响
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机译:薄膜生长机制对通过过滤的阴极真空弧沉积铝薄膜镜面反射率的影响
机译:(111)铝表面上薄镍膜的生长