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Characterization of microoptical elements by a stand-alone atomic-force microscope

机译:通过独立的原子力显微镜表征微光学元件

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Abstract: The microfabrication of optical and micromechanical elements requires a high degree of accuracy in order to obtain the required efficiency in the functionality of the element. An easy, nondestructive 3D characterization of the batch fabricated elements after each fabrication step is needed to ensure a reliable engineering control over the whole process. We demonstrate the versatility of a stand-alone AFM which can be used as a flexible tool for the nondestructive characterization of all steps of a fabrication sequence of microfabricated optical and micromechanical elements without the necessity to specially prepare the samples under test. !7
机译:摘要:为了获得所需的元件功能效率,光学和微机械元件的微加工需要很高的精度。在每个制造步骤之后,都需要对批量制造的元件进行简单,无损的3D表征,以确保对整个过程进行可靠的工程控制。我们展示了一个独立的AFM的多功能性,它可以用作一种灵活的工具,用于无损表征微制造的光学和微机械元件的制造序列的所有步骤,而无需专门准备待测样品。 !7

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