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Using Cynthia SOI MOSFET to Improve Voltage Gain of Analog Integrated Circuits

机译:使用Cynthia SOI MOSFET改善模拟集成电路的电压增益

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Theoretically, the surrounding gate SOI MOSFET presents the best possible control of gate region and consequently the best possible Electrostatic Integrity. Cynthia (circular-section) and Pillar (square-section) surrounding gate SOI MOSFETs are examples of this kind of structure. In this paper is performed a comparative study, by 3D numerical simulations, between Cynthia and Pillar surrounding gate SOI MOSFETs, focusing on analog integrated circuits applications, by studying the transconductance over drain current ratio behavior, regarding the same aspect ratio and bias conditions. Both, conventional and Graded-Channel technologies are regarded in this work. It is shown that Cynthia approach allows a voltage gain improvement of up to approximately 10% and 20% in comparison to Pillar surrounding gate SOI nMOSFET, when biased in weak and moderate inversion regimes, respectively.
机译:从理论上讲,周围的栅极SOI MOSFET提供了对栅极区域的最佳控制,因此也带来了最佳的静电完整性。围绕栅极SOI MOSFET的Cynthia(圆形截面)和Pillar(方形截面)就是这种结构的示例。本文通过3D数值模拟对Cynthia和Pillar围栅SOI MOSFET进行了比较研究,重点研究了模拟集成电路的应用,并研究了相同纵横比和偏置条件下跨导对漏极电流比的行为。这项工作既考虑了常规技术,又考虑了分级信道技术。结果表明,当分别在弱和中等反转模式下偏置时,与支柱环绕栅极SOI nMOSFET相比,Cynthia方法可以将电压增益提高多达大约10%和20%。

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