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Using Cynthia SOI MOSFET to Improve Voltage Gain of Analog Integrated Circuits

机译:使用Cynthia SOI MOSFET来提高模拟集成电路的电压增益

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Theoretically, the surrounding gate SOI MOSFET presents the best possible control of gate region and consequently the best possible Electrostatic Integrity. Cynthia (circular-section) and Pillar (square-section) surrounding gate SOI MOSFETs are examples of this kind of structure. In this paper is performed a comparative study, by 3D numerical simulations, between Cynthia and Pillar surrounding gate SOI MOSFETs, focusing on analog integrated circuits applications, by studying the transconductance over drain current ratio behavior, regarding the same aspect ratio and bias conditions. Both, conventional and Graded-Channel technologies are regarded in this work. It is shown that Cynthia approach allows a voltage gain improvement of up to approximately 10% and 20% in comparison to Pillar surrounding gate SOI nMOSFET, when biased in weak and moderate inversion regimes, respectively.
机译:从理论上讲,周围的栅极SOI MOSFET呈现了对栅极区域的最佳控制,因此最佳的静电完整性。周围栅极SOI MOSFET的辛西娅(圆形部分)和支柱(方段)是这种结构的示例。本文进行了比较研究,通过3D数值模拟,在辛西娅和柱围绕栅极SOI MOSFET之间,通过研究相同的纵横比和偏置条件来研究模拟集成电路应用。常规和分级渠道技术都被认为是这项工作。结果表明,与弱柱围绕栅极SOI NMOSFET分别偏离和中度反转制度分别偏置柱的纤维周围栅极SOI NMOSFET,辛西娅方法允许电压增益增加高达约10%和20%。

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