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Surface-Potential-Based RF Large Signal Model for Gallium Nitride HEMTs

机译:基于表面电位的氮化镓HEMT的RF大信号模型

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We present a physics based large signal RF compact model for Gallium Nitride HEMTs (GaN HEMTs). This surface-potential-based model is called Advance SPICE Model for GaN HEMT or ASM-GaN-HEMT model. Surface-potential (SP) in the triangular quantum well of GaN HEMTs is derived by solving Schrodinger's and Poisson's equations consistently and analytically. Core analytical drain-current model is derived using the developed SP model and drift-diffusion transport. The core model is enhanced with models for key real device effects to represent a real GaN HEMT device. A consistent intrinsic charge model is also derived from SP. The developed model is implemented in Verilog-A. Excellent model agreement with DC, S-parameters and large signal RF power sweep measurements are shown for a GaN HEMT device with width W = 40 μ956;m and number of fingers NF = 8.
机译:我们介绍了一种基于物理基于氮化镓HEMT(GaN Hemts)的大信号RF紧凑型模型。这种基于表面电位的模型称为GaN Hemt或ASM-GaN-HEMT模型的提前香料模型。 GaN Hemts的三角量子井的表面电位(SP)通过始终和分析地解决Schrodinger和Poisson的方程来源。使用开发的SP模型和漂移扩散传输来源核心分析漏极电流模型。核心模型随着关键真实设备效应的模型而增强,代表真正的GaN HEMT设备。一致的固有电荷模型也来自SP。开发的模型是在Verilog-A中实现的。具有DC,S参数和大信号RF功率扫描测量的优良模型协议,用于宽度W =40μ956; m和手指数NF = 8的GaN HEMT装置。

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