Soft X-ray Irradiation Effect on Surface Structure of CH_3NH_3PbI_3 Perovskite in Multi-Film Stack Device

摘要

Soft X-ray exposure effects on CH_3NH_3PbI_3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH_3NH_3PbI_3 to PbI_2 due to evaporation of methylammonium iodide.