首页> 外文会议>International Conference Scanning Probe Microscopy;Russia-China Workshop on Dielectric and Ferroelectric Materials;International Youth Conference Functional Imaging of Nanomaterials >Creation of thin superconducting MoCN thin film by cathode sputtering technique as a basic material for functional cryogenic nanoelements
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Creation of thin superconducting MoCN thin film by cathode sputtering technique as a basic material for functional cryogenic nanoelements

机译:通过阴极溅射技术创造薄超导MOCN薄膜作为功能低温纳米元件的基础材料

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Thin MoCN films were synthesized by a method of cathode sputtering of mosaic Mo-C targets by nitrogen ions at temperature of 800°C on substrates of the oxidized silicon. The temperature dependences of electrical resistance of the films in the range of 4.2-300°K were measured. Volt-ampere characteristics of the films and critical current density vs film thickness were obtained at a temperature of 4.2°K. The microstructure and film-depth chemical composition profiles of thin films were investigated by analytical techniques of the transmission electron microscopy (HRTEM, EELS) on a cross-section samples made by the focused ion beam (FIB). It was established that MoCN thin film at a thickness of 8 nm contained MoC and Mo5N6 layers. The high density of critical current in these films indicated prospects of their application in the field of cryogenic nanotechnologies.
机译:通过在氧化硅基板上在800℃的温度下通过氮离子的氮离子的阴极溅射的方法,通过氮离子进行薄MOCN薄膜。 测量薄膜电阻在4.2-300°K范围内的电阻的温度依赖性。 在4.2℃的温度下获得薄膜和临界电流密度Vs膜厚度的伏安特性。 通过透射电子显微镜(HRTEM,EEL)的分析技术对由聚焦离子束(FIB)制成的横截面样本的分析技术研究了薄膜的微观结构和薄膜深度化学成分。 建立了厚度为8nm的MOCN薄膜含有MOC和MO5N6层。 这些薄膜中的临界电流的高密度表明它们在低温纳米技术领域中的应用前景。

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