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Electron back scatter diffraction and x-ray pole figure analysis of c-axis textured α-alumina fabricated by gel-casting

机译:电子背面散射衍射和凝胶铸造纹理α-氧化铝的X射线极值分析

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In the present research, c-axis textured a-alumina ceramics have been prepared by an alginate-based, gel-cast, doctor-blade process. The macrotexture of the α-alumina ceramics was analysed by x-ray pole figure measurements and the c-axis texture nature was revealed using 00.12, 10.10 and 113 pole figures. In order to examine the regional grain orientation relations (microtexture), electron back scatter diffraction (EBSD) was applied in this work. Using EBSD, the boundary mis-orientation distribution was obtained and analysed. Apart from the well-developed low angle grain boundaries, a large fraction of boundaries were found misoriented in the range of 50-60°, implying the high possibility of forming Σ3 boundary in this c-axis textured α-alumina ceramic. Pole figures and inverse pole figures were also measured by EBSD patterns taken from the grains in the SEM scanned area, which confirms the c-axis texture symmetry determined by x-ray diffraction.
机译:在本研究中,通过基于藻酸盐的凝胶铸造的刮刀工艺制备了C轴纹理的A-alumina陶瓷。通过X射线极值测量分析α-氧化铝陶瓷的宏观构造,并且使用00.12,10.10和113极图示出了C轴纹理性质。为了检查区域晶粒取向关系(MicroTexture),在这项工作中应用电子背面散射衍射(EBSD)。使用EBSD,获得边界错误定向分布并分析。除了发育良好的低角度晶界之外,大部分边界被发现在50-60°的范围内,这意味着在该C轴纹理α-氧化铝陶瓷中形成σ3边界的高可能性。通过从SEM扫描区域中的谷物中取出的EBSD图案也测量极图和逆极极图,其证实由X射线衍射确定的C轴纹理对称。

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