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Improvements of the PLD (Pulsed Laser Deposition) method for fabricating photocathodes in ICMOS (Intensified CMOS) sensors

机译:ICMOS中PLD(脉冲激光沉积)方法的改进(脉冲激光沉积)方法(强化CMOS)传感器

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We introduce new technologies improving the PLD (Pulsed LaserDeposition) method to fabricate visible (370 ~ 600 nm) and NUV (NearUltraviolet, 185 ~ 320 nm) photocathodes for IIT (Image Intensifier Tube)sensors. The multi-purpose PLD VC (Vacuum Chamber) by utilizing opticalwindow viewports and a couple of internal carousels can do the whole processof the laser deposition of various alkalis, including the measurement the QE(Quantum Efficiency) in-situ, for multiple photocathode targets. Then, we haveintegrated a Load/Degassing/Assembly (LDA) VC to the PLD VC, to prepare,load, degas, and assemble the alkali targets and the photocathode substrates.With these facilities, we have manufactured high QE photocathodes free fromoxidation and water vapor contamination during the process. In this paper, wedescribe detail procedures of our new technologies to make S20 and CsTephotocathodes for visual and NUV wavelengths respectively, and discuss aboutthe test results of the IIT products.
机译:我们介绍了改善PLD的新技术(脉冲激光沉积)制造可见的方法(370〜600nm)和nuv(近IIT的紫外线,185〜320nm)光电阴极(图像增强器管)传感器。多用途PLD VC(真空室)利用光学窗口视口和几个内部转盘可以做整个过程各种碱的激光沉积,包括测量QE(量子效率)原位,用于多个光电阴极靶。然后,我们有将负载/脱气/组件(LDA)VC集成到PLD VC,以制备,载荷,脱胶和组装碱靶和光电阴极基板。通过这些设施,我们已经制造了高QE光电阴极物质该过程中的氧化和水蒸气污染。在本文中,我们描述我们新技术的细节程序,使S20和CSTE描述用于视觉和NuV波长的光电阴极,并讨论IIT产品的测试结果。

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