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Fabrication of Solution Combustion Based Transparent Semiconducting Titanium and Zinc Co-Doped Indium Oxide (ITiZO) Films

机译:基于溶液燃烧的透明半导体钛和锌共掺杂氧化铟(Itizo)膜的制备

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In this work, solution combustion processed titanium, zinc co-doped indium oxide high transparent semiconducting thin films were demonstrated at annealing temperatures of 300, 350 °C. In the process, low-temperature combustion at 123 °C was verified through thermogravimetric analysis; acetylacetone, 2-methoxyethanol served as fuel and solvent respectively in the redox reaction. Indium titanium zinc oxide (ITiZO) films were developed on glass substrates by spin coating followed by annealing at different temperatures. ITiZO films, powder exhibited high crystallinity exactly matching with indium oxide peaks without forming secondary phases. But, the presence of In, Ti, Zn, and O is clearly visible on film through energy dispersive spectroscopy. Films had transparency more than 85% in the visible range with optical band gap ranging 3.8-3.9 eV. These ITiZO films with smooth and low roughness ranging 0.46-0.5 nm, can have a potential application as an active layer in transparent thin film transistors and optoelectronic devices.
机译:在这项工作中,溶液燃烧加工钛,锌共掺杂氧化铟高透明半导体薄膜在300,350℃的退火温度下证明。在该过程中,通过热重分析验证123℃的低温燃烧;乙酰丙酮,2-甲氧基乙醇分别用作氧化还原反应中的燃料和溶剂。通过旋涂在玻璃基板上开发氧化钛氧化锌(Itizo)薄膜,然后在不同温度下退火。 Itizo薄膜,粉末表现出高结晶度与氧化铟峰完全匹配而不形成二次相。但是,在通过能量分散光谱上在膜上清楚地看到,Ti,Zn和O的存在。薄膜在可见范围内具有超过85%的透明度,光带间隙范围为3.8-3.9eV。这些具有光滑和低粗糙度的ITIZO膜的范围为0.46-0.5nm,可以具有透明薄膜晶体管和光电器件的有源层的潜在应用。

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