Investigation of opal nanostructures using scanning probe microscopy

摘要

The paper presents the research results on the creation of multilayer structures based on opal films using the methods of atomic force microscopy, tunnelling microscopy, and current spectroscopy. It is found that tunnelling microscopy methods are applicable for studying chromium-opal-gold-carbon layered structures. Surface images and current-voltage characteristics of each layer arc shown. It is shown that the formation of film structures on the surface of opal matrix starts with "islands" on lops of silica spheres. It is found that the deposition of carbon films on the surface of the chrome-opal-gold structure leads to increase in tunnel currents in the probe-sample gap. The presented results may be used for the formation of a variety of layered structures and particle arrays on the surface of opal matrix, e.g., photonic devices, sensitive elements, and emission devices.