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TRANSIENT SOLDER SEPARATION OF BGA SOLDER JOINT DURING SECOND REFLOW CYCLE PHASE III - THE IMPACT OF BACK DRILL

机译:第二回流循环阶段III期间BGA焊点的瞬态焊接分离 - 后钻的影响

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Via In Pad Plated Over (VIPPO) has become an inevitable via-pad structure in high density routing design. The benefits of adopting the VIPPO design includes, for example, reducing signal path lengths and increases board functionality density. However, the long Cu barrel of the via structure has an adverse antenna effect on signal integrity. There are two common practices to minimize the antenna effect. First is to mix VIPPO with the dog-bone via design. The other is to reduce the Cu barrel length by back drilling. For the VIPPO and dog bone mixed design, due to the CTE mismatch between the Cu and PCB material, solder separations are found between the bulk solder and IMC on the package side. The root cause analysis can be found in Phase I~1 of this study. The proof of primary driving force, the timing of separation, and the duration of separation can be found in Phase II~2 of this study. This study (Phase III) focuses on the impact of back drill. The idea is to minimize the impact of antenna effect on signal integrity by reducing the length of the Cu barrel. To an extent, it won't induce the solder separation. In the other words, it is to find the "safe" back drill length without causing the solder separation. A 4"×5" daisy chained test vehicle in 93mil and 125mil board thickness with OSP surface finishing is used. For the memory device on the board, there is one daisy chain connected to each of the 24 pairs of VIPPO and VIPPO pad with back drill design. And, the 25th daisy chain connect to the rest of 30 VIPPO pad with back drill design. With this paired daisy chain design the continuity of each VIPPO and VIPPO with back drill pair can be monitored in-situ and in real time throughout the reflow process. Seven back drill depth are incorporated, including 50%, 64%, 69%, 75%, 80%, 86%, and 92%. The continuity and resistance values, of each VIPPO and VIPPO with back drill pair, are collected in real time through data logger. There are two folds of objectives. One is to find the trend of percent of solder separation pins vs. back drill depth. The other is, based on the trending data, to find the "safe" back drill length (or percentage) without causing solder separation.
机译:通过焊盘镀焊(Vippo)已成为高密度路由设计中的必然通孔结构。采用Vippo设计的好处包括例如减少信号路径长度并增加板功能密度。然而,通孔结构的长Cu桶对信号完整性具有不利的天线效应。有两个常见的做法来最小化天线效应。首先是通过设计将Vippo与狗骨混合。另一个是通过后钻降低Cu桶长度。对于Vippo和Dog骨混合设计,由于Cu和PCB材料之间的CTE失配,在包装侧的散装焊料和IMC之间发现了焊料分离。可以在本研究的I〜1中找到根本原因分析。初级驱动力的证据,分离的时间和分离的持续时间可以在本研究的II〜2中找到。本研究(III期)专注于后钻的影响。该思想是通过减少Cu桶的长度来最小化天线影响对信号完整性的影响。在某种程度上,它不会引起焊料分离。换句话说,它是在不导致焊料分离的情况下找到“安全”后钻长度。使用了4“×5”菊花在93mil和125mil板厚度的菊花测试载体,具有OSP表面精加工。对于电路板上的存储器设备,有一个菊花链连接到24对Vippo和Vippo垫中的每一个,带有后钻设计。而且,第25个雏菊链连接到剩下的30个Vippo垫,背钻设计。通过这种成对的雏菊链设计,可以在整个回流过程中实时监控每个Vippo和Vippo的连续性和vippo的连续性,并实时监控。掺入七次钻钻深度,包括50%,64%,69%,75%,80%,86%和92%。通过数据记录器实时收集每个VIPPO和VIPPO的连续性和阻力值,每个VIPPO和VIPPO都会收集。有两种目标。一个是找到焊接分离引脚百分比的趋势与后钻深度。另一种是基于趋势数据,找到“安全”后钻头长度(或百分比)而不会导致焊接分离。

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