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SiC JFET integrated circuits for sensing and control at temperatures up to 600#x00B0;C

机译:SiC JFET集成电路,用于在高达600°C的温度下进行传感和控制

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N-channel JFET integrated circuits were fabricated in 6H silicon carbide, a wide-bandgap semiconductor capable of operation at extremely high temperatures, to support applications in high-temperature sensing and control commonly found in systems that consume or generate large quantities of energy. The JFETs were successfully modeled, and hybrid amplifiers were constructed using SiC differential pairs and silicon active/passive components to provide a high-temperature sensor interface circuit requiring minimal SiC integration. Fully integrated, differential amplifiers were designed, fabricated, and tested. A two-stage amplifier with current-source loads and common-mode feedback in the 1st-stage, has a voltage gain of 69 dB at 576°C, with just 3.6 dB gain-variation from 25 to 576°C. High-performance, integrated logic circuits were also developed. The inverter has excellent dc characteristics with a gain > −20 up to 500°C. NAND/NOR logic circuits were tested dynamically and perform well at temperatures up to 550°C.
机译:N沟道JFET的集成电路是在6H碳化硅,在极高温度下的宽禁带半导体能够操作的制造,以便在消耗或产生大量能量的系统中常见的高温的感测和控制的支持的应用程序。所述JFET的成功建模,并且使用SiC差动对和硅有源/无源组件来提供需要最小的SiC集成的高温传感器接口电路构建混合放大器。完全集成的,差分放大器被设计,制造和测试。与电流源的负载和共模反馈的两级放大器的第一级,具有576℃下为69 dB的电压增益,以从25到576仅需3.6 dB的增益的变化率℃。高性能,还开发了集成逻辑电路。该逆变器具有带有增益出色的直流特性> -20到500℃。 NAND / NOR的逻辑电路进行动态测试,并在温度表现良好高达550℃。

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