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Effect of Light Intensity on Schottky Barrier Widths and I-V Characteristics of Polymer Heterojunction Photodiodes

机译:光强度对聚合物异质结光电二极管肖特基屏障宽度和I-V特性的影响

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The Schottky barriers that forms on the interface between aluminum and organic semiconductor of polymer heterojunction photodiodes based on poly(3-hexylthiophene): [6,6]-phenyl-C_(61)-butyric acid methylester blend, has been investigated according to Mott-Schottky curves. We focused on the effect of light intensity on the Schottky barrier widths and I-V characteristics of the devices. Comparison of the mathematical models and experimental data measured under different light intensities indicate a dependency of Schottky barrier to the light intensity.
机译:基于聚(3-己烯烯)的聚合物异质结光电二极管铝和有机半导体界面的肖特基屏障:[6,6] -phenyl-C_(61) - 根据Mott进行了研究,对丁酸甲基酯混合进行了研究-schottky曲线。我们专注于光强度对器件的肖特基屏障宽度和I-V特性的影响。在不同光强度下测量的数学模型和实验数据的比较表明肖特基势垒对光强度的依赖性。

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