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A More Accurate Potential-Based Drain Current Model for Bulk-MOSFETs

机译:批量 - MOSFET的一种更准确的基于潜在的漏极电流模型

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摘要

This paper presents a new and more accurate potential based model for bulk MOSFET compared to the traditional charge-sheet surface potential model. The channel potential of the bulk MOSFET is obtained by solving Poisson equation and an accurate current expression is obtained base on it. Taking Pao-Sah model as a standard, the relative errors of the charge-sheet model may be as large as 4% in the saturation region while that of the present model is less than 1.05%.
机译:与传统的充电板表面电位模型相比,本文提出了一种新的散装MOSFET潜在的潜在模型。通过求解泊松方程,可以获得散装MOSFET的通道电位,并获得精确的电流表达。服用Pao-SAH模型作为标准,电荷片模型的相对误差可以在饱和区域中大至4%,而本模型的相对误差小于1.05%。

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