Advanced SOI CMOS transistor technology for high performance microprocessors

摘要

In this paper we present, an overview of partial depleted Silicon on Insulator (PD SOI) CMOS transistor technologies for high performance microprocessors. To achieve a "high performance per watt" figure of merit, transistor technology elements like PD SOI, strained Si, aggressive junction scaling, asymmetric devices need hand-in-hand development with multiple core- and power efficient designs. These techniques have been developed, applied and optimized for 65/45nm volume manufacturing at GLOBALFOUNDRIES in Dresden. To enable further transistor scaling to 32nm design rules, High K Metal Gate (HKMG) technology is key. Different HKMG integrations as well as future strained Si technologies like strained silicon directly bonded on SOI and embedded Si:C are discussed.