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On-chip Timing Uncertainty Measurements on IBM Microprocessors

机译:IBM微处理器上的片上时序不确定性测量

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Timing uncertainty in microprocessors is comprised of several sources including PLL jitter, clock distribution skew and jitter, across chip device variations, and power supply noise. The on-chip measurement macro called SKITTER (SKew+jITTER) was designed to measure timing uncertainty from all combined sources by measuring the number of logic stages that complete in a cycle. This measure of completed delay stages has proven to be a very sensitive monitor of power supply noise, which has emerged as a dominant component of timing uncertainty. This paper describes the Skitter measurement experiences of several IBM microprocessors including PPC970MP, XBOX360TM, CELL Broadband EngineTM, and POWER6TM microprocessors running different workloads.
机译:微处理器中的时序不确定性由包括PLL抖动,时钟分布偏差和抖动的多个来源包括芯片器件变化和电源噪声。芯片上的片上测量宏称为Skeritter(Skew +抖动),旨在通过测量在循环中完成的逻辑阶段的数量来测量所有组合源的时序不确定性。完成延迟阶段的这种措施已被证明是一种非常敏感的电源噪声监测,这已成为时序不确定性的主要成分。本文介绍了多个IBM微处理器的SKITTER测量体验,包括PPC970MP,Xbox360 TM ,电池宽带发动机 TM ,电机6 TM 微处理器进行不同的工作负载。

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