Leveraging IEEE 1641 for Tester-Independent ATE Software

摘要

Three critical issues for semiconductor test development are test reuse, portability, and translation from design information. In the military/aerospace market, the IEEE Standard for Signal and Test Definition (IEEE 1641-2004) addresses similar requirements and may be highly relevant to the semi-test domain. The authors evaluate this standard's applicability to semi-test mixed signal use cases for possible direct use as, or inspiration for, a hardware-independent tester interface for ATE.