首页> 外文会议>International Conference on Electronic Packaging Technology High Density Packaging >A Study to Performance of Electroplating Solder Bump in Assembly
【24h】

A Study to Performance of Electroplating Solder Bump in Assembly

机译:电镀焊料凸块在组装中性能的研究

获取原文

摘要

The electroplating methodology in assembly is better than the stencil printing manufacturing in pre-WLCSP, (wafer-level chip-scale packaging), especially in quality. Through eight-step process requiring one photolithographic mask; the pre-WLCSP procedures for the electroplating solder' bump technology are able to be completed. Comparing this technology with the electroplating gold bump technology, the cost in "the. previous is more impressive even though the performance of this technology is little lower than the last. Therefore, in this .study, the electroplating solder bump in assembly was probed in detail to analyze the possibility or mass-production.
机译:组装中的电镀方法优于WLCSP前的模版印刷制造,(晶圆级芯片尺度包装),特别是质量。通过需要一个光刻面膜的八步过程;电镀焊料凸块技术的WLCSP程序能够完成。将这项技术与电镀金凸块技术进行比较,即使这项技术的性能低于最后一个。因此,在这个技术中,探测器中的电镀焊料凸块探测器中的电镀焊料凸块的性能甚至更令人印象深刻。细节分析可能性或大规模生产。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号