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Various phases formation and reliability of Sn-8Zn-3Bi solder-(PPT)

机译:SN-8ZN-3BI焊料的各种阶段形成和可靠性 - (PPT)

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Spreading ratio of Sn8Zn3Bi on Au/Ni decreased drastically from 0.3μm of Au-thickness due to production and floating of AuZn IMC in solder. 2. In the joint of Sn15Pb-plated lead with Sn8Zn3Bi, crack was generated by low melting temperature phase of SnPbBi, and the crack propagated during thermal shock test. However, Ni/Au-finished PCB can avoid or retard crack and secure better strength than the Sn37Pb solder. 3. During HTH test, ZnO-phase in Sn8Zn3Bi grew like a long branch, and crack was produced in the branch. The reason seems to be a volume expansion cased by phase transformation from Zn to ZnO.
机译:由于Auzn IMC在焊料中的生产和漂浮,SN8ZN3BI对Au / Ni上的SN8ZN3BI对Au / Ni的扩散比率从0.3μm厚度下降。 2.在SN8ZN3BI的SN15PB镀铅的关节中,通过SNPBBI的低熔点阶段产生裂缝,并且在热冲击试验期间裂纹传播。然而,Ni / Au-in完成的PCB可以避免或延迟裂缝,并且比SN37PB焊接能力更好。 3.在HTH测试期间,SN8ZN3BI中的ZnO相同样像长分支一样,在分支中产生裂缝。原因似乎是从Zn到Zno的相位变换套件的体积扩展。

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