首页> 外文会议>Conference on Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS >Effects of V additions on the mechanical behavior of Au thin films for MEMS contact switches
【24h】

Effects of V additions on the mechanical behavior of Au thin films for MEMS contact switches

机译:V添加对MEMS触头开关的Au薄膜力学行为的影响

获取原文

摘要

Au, Au-V solid solution, and Au-V_2O_5 dispersion films were fabricated for comparison of electrical and mechanical characteristics. Resistivity and nanoindentation hardness increased with increasing V content in all films, but the ratio of resistivity increase to hardness increase was much lower for the Au-V_2O_5 films. Measurements of contact force and electrical contact resistance between pairs of Au or Au-V films show that increased hardness and resistivity in the alloy films results in higher contact resistance and less adhesion than in pure Au. These results imply that the AU-V_2O_5 films may exhibit attractive behavior when used in a contact configuration, but this has not yet been tested.
机译:制备Au,Au-V固溶体和Au-V_2O_5分散膜,用于比较电气和机械特性。 电阻率和纳米狭窄硬度随着所有薄膜的V含量增加而增加,但是Au-V_2O_5薄膜的电阻率增加到硬度的比率升高得多。 Au或Au-V膜对之间接触力和电接触电阻的测量表明,合金薄膜中的硬度和电阻率增加导致较高的接触电阻和比纯Au的粘附更少。 这些结果意味着当在接触配置中使用时,Au-V_2O_5薄膜可能表现出有吸引力的行为,但这尚未测试。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号