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Lead Zirconate Titanate Thin Films Directly on Copper Electrodes for Embedded Passive Applications

机译:直接在铜电极上铅锆钛酸薄膜,用于嵌入式被动应用

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We demonstrate that it is possible to process lead zirconate titanate (Pb(Zr{sub}0.52Ti{sub}0.48)O{sub}3) thin films directly on base metal copper foils. Films were prepared by chemical solution deposition, pre-annealed to pyrolyze organic constituents, and annealed at 650°C for 15 minutes. We explore the impact of the oxygen partial pressure during processing, and demonstrate that high quality films and interfaces can be achieved through control of the pO{sub}2 within a narrow window predicted by thermodynamic stability considerations. Resultant films have good electrical properties with saturation polarization values around 55 μC/cm{sup}2, and switching polarization (~2P{sub}r) around 40 μC/cm{sup}2. Zero bias dielectric constants are around 1100. The demonstration opens up the possibility of the use of low cost, high conductivity copper electrodes for a range of Pb-based perovskite materials, including PZT films in embedded printed circuit board applications for capacitors. The other broad implications include embedded printed circuit board applications for varactors, and sensors; multilayer PZT piezoelectric stacks; and multilayer lead magnesium niobate-lead titanate-based dielectric and electrostrictive devices. We also point out that the capacitors upon repeated switching do not fatigue like those with Pt noble metal electrodes, but instead appear to be fatigue resistant like capacitors with oxide electrodes. This has important implications for ferroelectric nonvolatile memories.
机译:我们证明可以在基础金属铜箔上直接处理钛酸钛酸钛酸盐(PB(Zr {Sub} 0.52Ti {Sub} 3)薄膜。通过化学溶液沉积制备薄膜,预退火以热解有机成分,并在650℃下退火15分钟。我们探讨了在加工过程中氧气分压的影响,并证明了通过控制热力学稳定性考虑因素预测的窄窗口中的PO {SUB} 2的控制来实现高质量的薄膜和接口。得到的薄膜具有良好的电性能,饱和偏振值约为55μC/ cm {sup} 2,并且切换偏振(〜2p {sub} r)约为40μc/ cm {sup} 2。零偏置介电常数约为1100.演示开启了使用低成本,高导电性铜电极的可能性,用于一系列PB的钙钛矿材料,包括用于电容器的嵌入式印刷电路板应用中的PZT薄膜。其他广泛的含义包括用于容纳器和传感器的嵌入式印刷电路板应用;多层PZT压电堆;和多层引线铌酸铅 - 铅钛酸铅基电介质和电致伸缩装置。我们还指出,在重复切换时的电容器不会像具有PT贵金属电极那样的疲劳,而是似乎与具有氧化物电极的电容器相同的抗疲劳性。这对铁电非易失性记忆具有重要意义。

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