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Indentation Rate-dependent Creep Behavior of Sn-Ag-Cu Pb-free Ball Grid Array (BGA) Solder Joint

机译:SN-AG-CU PB的缩进率依赖性蠕变行为SN-AG-CU PB-BALL网格阵列(BGA)焊点

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摘要

Berkovich micro-indentation tests with different loading rates have been performed on the ball grid array solder joint with a Pb-free solder, Sn-4.0Ag-0.5Cu alloy. The resulting indentation load-depth curves are rate dependent and have varying creep penetration depths during the same hold time. Creep indentation hardness and rate sensitivity have been defined from the concept of "work of indentation". The rate sensitivity of BGA solder joint is 0.0574.
机译:在球栅阵列焊点上进行了具有不同装载速率的Berkovich微压痕试验,其具有无铅焊料,Sn-4.0Ag-0.5Cu合金。得到的压痕负载深度曲线是速率相关的,并且在相同的保持时间期间具有变化的蠕变渗透深度。蠕变压痕硬度和速率敏感度已经从“缩进工作”的概念中定义。 BGA焊点的速率灵敏度为0.0574。

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