Surface Microscopy Characterizations of Large Size Graphene films Grown by Surface Segregation on Ni and Transferred to Si/SiO_2 Substrate

摘要

We report surface microscopy characterizations of large size graphene films (up to mm) grown on polycrystalline Ni foils and transferred to Si/SiO_2. Wrinkles in such films are studied by both atomic force microscopy (AFM) and scanning tunneling microscopy (STM). Local graphitic lattice structures of the films are imaged with atomic-resolution STM and compared with those of the highly ordered pyrolytic graphite (HOPG).