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Stacking fault and growth direction of β-SiC whisker synthesized by carbothermal reduction

机译:β-SiC晶须的堆叠故障和生长方向由Carbothotmal减少合成

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The whisker morphology and whisker content in the β-SiC powder synthesized from SiO{sub}2 and carbon black were more closely related to SiO partial pressure than reaction temperature. By controlling the SiO partial pressure through the change of stacking manner and the mixing of starting powder, deflected whiskers were successfully synthesized. The whisker deflection deeply depended on the inserted direction of stacking fault. The deflection angles of the whiskers synthesized from the mixed and the stacked powder were 55° and 109°, respectively. The deflected whisker with 55° was formed by the existence of stacking fault planes not perpendicular to the growth direction of the whisker. The deflected whisker with 109° had three different directions of stacking faults of {111} planes including twin faults.
机译:从SiO {亚} 2合成的β-SiC粉末中的晶须形态和晶须含量与SiO部分压力比反应温度更密切地与SiO部分压力更密切。通过通过堆叠方式的变化和起始粉末的混合来控制SiO分压,成功地合成了偏转的晶须。晶须偏转深入依赖于堆叠故障的插入方向。从混合和堆叠粉末合成的晶须的偏转角度分别为55°和109°。通过存在堆叠故障平面而不是垂直于晶须的生长方向的堆积而形成的偏转晶须。具有109°的偏转晶须具有三种不同方向的{111}平面堆叠故障,包括双重故障。

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