Internal mechanical stresses and conductivity mechanisms of p-n-InAsPSb/InAs heterostructures

摘要

Influence of internal mechanical stresses (IMS) and dislocations on conductivity mechanisms and reliability of light emitting diode (LED) and laser InAsPSb/InAs double heterostructures has been investigated. It was shown that the presence of lattice mismatch of layers at p-n-heteroboundaries changes LED conductivity mechanisms the same way as long-term working challenges by current. It was determined that LED degradation has barrier character and is followed by appearance and growth of tunnel current components with power dependence of current from voltage. Reliability and external quantum efficiency decrease with growth of lattice mismatch.