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Low dark current small pixel large format InGaAs 2D photodetector array development at Teledyne Judson Technologies

机译:低暗电流小像素大格式Ingaas 2D光电探测器阵列开发在Teledyne Judson Technologies

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Teledyne Judson Technologies (TJT) has been developing technology for small pixel, large format, low dark current, and low capacitance NIR/SWIR InGaAs detector arrays, aiming to produce <10μm pixels and >2Kx2K format arrays that can be operated at or near room temperature. Furthermore, TJT is now developing technology for sub-10μm pixel arrays in response to requirements for a variety of low light level (LLL) imaging applications. In this paper, we will review test data that demonstrates lower dark current density for 10-20μm pixel arrays. We will present preliminary results on the successful fabrication of test arrays with pixels as small as 5μm. In addition, a lot of effort has been made to control and reduce the detector pixel capacitance which can become another source of detector noise. TJT is also developing 4" InGaAs wafer process and now offers four different types of InGaAs 2D arrays/FPAs that are tailored to different customer requirements for dark current, capacitance, spectral response, and bias range.
机译:Teledyne Judson Technologies(TJT)一直在开发用于小像素,大型格式,低暗电流和低电容NIR / SWIR IngaAs探测器阵列的技术,旨在产生10μm像素和> 2kx2k格式阵列,可在房间或附近运行温度。此外,TJT现在正在开发用于Sub-10μm像素阵列的技术,响应于对各种低光电平(LLL)成像应用的要求。在本文中,我们将审核测试数据,该测试数据显示10-20μm像素阵列的较低暗电流密度。我们将在成功制造测试阵列的初步结果上,像素一样小至5μm。此外,已经进行了许多努力来控制和减少可以成为探测器噪声源的另一个源极的探测器像素电容。 TJT也在开发4“InGaAs晶圆过程,现在提供四种不同类型的IngaAs 2D阵列/ FPA,用于对暗电流,电容,光谱响应和偏置范围的不同客户要求。

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