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Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process

机译:窄锯街(60um)和厚晶片(600um)锯切工艺组合的切削自由过程

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Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metallization causing higher blade loading during mechanical sawing. This leads to chipping penetrating under the guard ring and damaging the active area. This paper will share all the activities towards chipping free process on a device involving optimization through mechanical sawing, infra red camera and laser grooving process. Blade selection involving various diamond grit size, different concentration, slit design and low k types only able to minimize the occurrence but not totally eliminate it. Finally by performing laser grooving, significant results were achieved with zero chipping occurrences. In addition, suitable laser frequency selection is also important to ensure the best performance. In this case higher frequency laser grooving in combination with mechanical sawing process found to be able to meet the requirement.
机译:碎片是晶圆锯切过程的梦想。通过缩小锯街宽度,晶圆技术的高度复杂性加上降低成本降低的驱动,这是一项挑战,这需要巨大努力实现晶圆锯切过程实现落地过程。机械锯切期间导致更高叶片加载的金属化较高密度。这导致在防护环下渗透并损坏有源区域。本文将分享所有活动,可以通过机械锯,红外线相机和激光槽工艺涉及涉及优化的设备进行切碎的过程。叶片选择涉及各种金刚石砂砾尺寸,不同浓度,缝隙设计和低k型只能最小化发生但不完全消除它。最后通过执行激光凹槽,通过零切屑出现实现显着的结果。此外,合适的激光频率选择也很重要,无法确保最佳性能。在这种情况下,与机械锯工艺相结合的较高频率的激光槽,发现能够满足要求。

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