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How to Grow 3C-SiC Single Domain on α-SiC(0001) by Vapor-Liquid-Solid Mechanism

机译:如何通过气相 - 固体机制在α-SiC(0001)上生长3C-SiC单结构域

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We report on the heteroepitaxial growth of 3C-SiC layers by Vapor-Liquid-Solid (VLS) mechanism on various a-SiC substrates, namely on- and off-axis for both 4H and 6H-SiC(0001), Si and C faces. The Si-Ge melts, which Si content was varied from 25 to 50 at%, were fed by 3 sccm of propane. The growth temperature was varied from 1200 to 1600°C. It was found that single-domain 3C-SiC layers can be obtained on 6H-SiC off and on-axis and 4H-SiC on-axis, while the other types of substrate gave twinned 3C-SiC material. As a general rule, one has to increase temperature when decreasing the Si content of the melt in order to avoid DPB formation. It was also found that twinned 3C-SiC layers form at low temperature while homoepitaxy is achieved at high temperature.
机译:我们通过蒸汽 - 液固 - 固体(VLS)机理在各种A-SiC基板上的杂膜增长,即4h和6h-SiC(0001),Si和C面的轴和轴上的偏离轴。 Si-Ge熔融,Si含量从25%变化为0%,由3分泌丙烷加入3 sccm。生长温度从1200-1600℃变化。发现可以在6H-SiC脱离和轴上和4H-SiC上轴上获得单结构域3C-SiC层,而其他类型的基材可以获得孪晶的3C-SiC材料。作为一般规则,在降低熔体的Si含量以避免DPB形成时,必须提高温度。还发现,在低温下,在低温下形成孪晶的3C-SiC层,同时在高温下实现。

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