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N- AND P- TYPE LATERAL DMOSFETS INTEGRATION AND OPTIMIZATION IN AN ADVANCE RF BICMOS TECHNOLOGY

机译:先进的RF BICMOS技术中的N-和P型横向DMOSFET集成和优化

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Integration of RF power amplifier in silicon technology is a new challenge. SiGe:C HBT and RF lateral DMOS are the two main candidates to achieve this objective. A technology, which can propose these two devices at the same time, can be useful in order to combine the advantage of each. In this paper, the integration and optimization of RF N- and P-type lateral DMOSFETs in an advanced 0.25^m RF BiCMOS technology are presented. The main optimization steps on DC and RF parameters are described. Parameter trade off during optimization are highlighted: it is been shown that not oniy Ron and BVds must be considered; loff can also detennine optimization. Improvement of dynamic performances by using CoSi2 instead of TiSi2 as salicide material is demonstrated on our lateral N-type DMOSFET with a 20% improvement on Fmax.
机译:RF功率放大器在硅技术中的集成是一个新的挑战。 SiGe:C HBT和RF横向DMOS是实现这一目标的两个主要候选者。一种可以同时提出这两个设备的技术可以是有用的,以便组合每个的优点。本文提出了先进的0.25 ^ M射频技术技术中RF n-和P型横向DMOSFET的集成和优化。描述了DC和RF参数的主要优化步骤。优化期间的参数折衷突出显示:已被视为不得考虑未ony ron和bvds; Loff也可以确定优化。在我们的侧面N型DMOSFET上证明了通过COSI2而不是TISI2改善COSI2而不是TISI2的改善。

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