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Technological processes for microheater and micro-hot-plate in the implementation of a MEM gas sensor

机译:MEM气体传感器实施中微热器和微型电镀的技术过程

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In this work a microsystem fabrication process for a microheater (MH) and a microhotplate (MHP), as well as their electrical behavior, are reported. This microstructure consists of a SiO/sub 2/ membrane supported by four cross shaped beams, and two layers of polysilicon (poly1 and poly2); poly1 forms the microheater and the poly2 layer works as a micro hot plate (MHP), whose function is to achieve a homogeneous temperature distribution all over the microsystem. Both poly1 and poly2 are separated by a SiO/sub 2/ layer, isolating them electrically, and were patterned by lift off process. The microstructure or membrane is located over a micropit (IMP) that was made by etching the Si substrate with KOH for seven hours; a Si/sub 3/N/sub 4/ sacrifice layer was used for this purpose. Electrical contact for the layers was made evaporating aluminum and patterned by lift off also. Electrical measurements were made by applying a ramp from -1.5 V through 1.5 V and measuring the current through poly1 and poly2, with temperature as a parameter, changing temperature with 25 /spl deg/C steps, from room temperature up to 300/spl deg/C, heating and cooling. The temperature coefficient of resistance (TCR) for poly1 and poly2 was calculated.
机译:在这项工作中,报道了微热器(MH)和微壳体(MHP)的微系统制造方法以及它们的电动行为。该微结构包括由四个交叉形梁支撑的SiO / Sub 2 /膜,以及两层多晶硅(Poly1和Poly2); Poly1形成微热器,Poly2层用作微热板(MHP),其功能是在微系统上实现均匀的温度分布。 Poly1和Poly2都是通过SiO / Sub 2 /层分离的,通过剥离工艺进行电气地隔离它们。微观结构或膜位于通过用KOH蚀刻七小时而通过蚀刻Si衬底而制成的微量化(Imp)。为此目的使用Si / Sub 3 / N / Sub 4 /牺牲层。将图层的电触头蒸发铝,并通过升空图案。通过从-1.5V至1.5V施加斜坡并通过Poly1和Poly2测量电流来进行电气测量,温度为参数,用25 / SPL DEG / C步骤更换温度,从室温高达300 / SPL DEG / c,加热和冷却。计算Poly1和Poly2的电阻温度系数(TCR)。

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