adhesives; flip-chip devices; failure analysis; finite element analysis; viscoelasticity; reliability investigations; encapsulated isotropic conductive adhesives; flip chip interconnection; electronic manufacturing; failure mechanism; product lifetime measurement; cross section observation; module warpage scanning; chip-size effect; ICA lifetime; warpage measurement; shear stress; ICA reliability; finite element method; visco-elastic models; adhesives models; underfill materials; elastic model; lifetime relationship; Coffin-Manson formula; thermal fatigue life; encapsulated ICA flip chip;
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