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Liquid-phase epitaxy of solid solutions (Sn_2)_x(InSb)_(1-x) on GaAs substrate.

机译:GaAs衬底上的固溶体(SN_2)_X(INSB)_(1-X)的液相外延。

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Method liquid phase epitaxy from of a solution of a melt the solid solution (Sn_2)_x(InSb)_(1-x) is brought up, and also the heterostructures nGaAs-p(Sn)_x(InSb)_(1-x) are obtained. By a method of an X-ray diffraction is shown that, obtained of a film have a high enough monocrystallinity. The measuring have shown, that obtained nGaAs-p(Sn)_x(InSb)_(1-x) the structures have responsively in an 5-1 microns interval. Breadth of a forbidden region of a solid solution (Sn_2)_x(InSb)_(1-x) evaluated which has made E_g ~ 0,11-0,12 eV.
机译:方法液相外延从熔体溶液中的固体溶液(SN_2)_X(INSB)_(1-X)的溶液产生,并且异质结构NGAAS-P(SN)_X(INSB)_(1-x获得)。通过一种X射线衍射的方法,示出了,获得的薄膜具有足够高的单晶性。所示测量已经显示,获得的NGAAS-P(SN)_x(INSB)_(1-x),结构响应于5-1微米的间隔。禁止区域的诸如e_g〜0.11-0,12 eV的固体解决方案(SN_2)_(INSB)_(1-x)的禁区(SN_2)_(INSB)_(1-X)。

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