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Solder Joint Behavior of Area Array Packages in Board Level Drop for Handheld Devices

机译:焊接设备载级阵列套件的焊接联合行为

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Board level drop test is convenient to characterize. The solder joint performance, as it is more controllable than system level drop, i.e. cellular phone drop. A free fall board level drop test was studied to compare the effectiveness with the cellular phone drop. Acceleration in both cases was measured to determine the severity of the drop test. From this study, it can be concluded that the acceleration of PCB board changes from 2700 to 6000G, which is much larger than that in system level drop. A large displacement of PCB board for board level drop was also recorded but the warpage at the locations of area array package and plastic strain of solder joints could be relatively small. This may explain why most solder joints in the area array packages can survive more than 100 tunes of drop at the board level drop without failure. The mechanism of the board deflection was studied and it is found that constraint on the board edge played a key role. To get the same level of plastic strain in the solder joints as the system level drop, a simple fixture is suggested to constrain the boards. In this way, the board warpage and plastic strain of the solder joints in the board level drop may become closer to those in the system level drop.
机译:板级跌落测试是方便的表征。焊接关节性能,因为它比系统级别下降更控制,即蜂窝电话掉落。研究了自由落体板级滴测试,以比较与蜂窝电话下降的有效性。测量两种情况下的加速度以确定下降试验的严重程度。从本研究开始,可以得出结论,PCB板的加速度从2700到6000g变化,比系统级下降大得多。还记录了用于板级下降的PCB板的大量位移,但区域阵列封装的位置和焊点的塑料应变的位置可能相对较小。这可以解释为什么地区阵列包装中的大多数焊点可以在没有故障的情况下在板级下降处存活超过100个液滴。研究了板偏转的机制,发现董事会边缘的约束发挥了关键作用。为了在焊点中获得相同水平的塑料应变作为系统水平下降,建议简单的夹具来限制电路板。通过这种方式,板级下降中焊点的焊接接头的翘曲和塑性应变可能变得更接近系统水平下降的液位。

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