首页> 外文会议>International Conference on the Physics of Semiconductors >Effects of Oxygen Contents in the Active Channel Layer on Electrical Characteristics of IGZO-Based Thin Film Transistors
【24h】

Effects of Oxygen Contents in the Active Channel Layer on Electrical Characteristics of IGZO-Based Thin Film Transistors

机译:氧气含量在极型沟道层中的影响IGZO基薄膜晶体管的电特性

获取原文

摘要

The authors report the fabrication of high performance a-IGZO thin film transistors (TFTs) with polymer gate dielectric prepared by spin-coating on a glass substrate. It was found that transmittance of the deposited polymer film was larger than 90percent at 600 nm. It was also found that the a-IGZO TFT prepared with 0.14percent oxygen partial pressure with annealing could provide us a higher mobility (i.e., 17.5 cm~(2)/Vs) while maintaining good substrate swing and good I_(on)/I_(off).
机译:作者报告了通过在玻璃基板上通过旋涂制备的聚合物栅极电介质的高性能A-IGZO薄膜晶体管(TFT)的制造。发现沉积的聚合物膜的透射率大于600nm的90%。还发现,用退火的01414分氧分压制备的A-IgZO TFT可以为我们提供更高的迁移率(即,17.5cm〜(2)/ vs),同时保持良好的基材摆动和良好的I_(ON)/ I_ (离开)。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号