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Comparison of carrier lifetime for InAs quantum dots in the quaternary barriers on InP substrate

机译:在INP基板上季屏屏障中载体寿命的载流子寿命比较

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We have found that the carrier lifetime of an InAs/InGaAsP quantum dot (QD) on an InP substrate is twice that of an InAs/InAlGaAs QD on the same substrate, although the ground-state energy levels and barrier heights of these QDs are comparable. The carrier lifetime of the IrLAs/InAlGaAs QD within the ground state PL band is shorter as the detection wavelength is longer. On the contrary, it shows the same carrier lifetime for the InAs/InGaAsP QD. The difference is interpreted in terms of the smaller conduction band-offset in InAs/InGaAsP QDs compared to InAs/InAlGaAs QDs.
机译:我们发现INP基板上的INAS / INGAASP量子点(QD)的载体寿命是同一基板上的INAS / INALGAAS QD的两倍,尽管这些QD的地位能级和屏障高度是可比的。当检测波长较长,IRRAS / INALGAAS QD的载流子/ inalgaas QD的寿命较短。相反,它显示了INAS / INGAASP QD的相同载体寿命。与INAS / INALASP QDS的较小导通带偏移而言,与INAS / INALGAAS QDS相比,差异被解释。

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