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Epitaxial MnCdHgTe Layers Obtained by RF Sputtering in Mercury Plasma

机译:通过RF溅射在汞等离子体中获得的外延MNCDHGTE层

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Thin MnCdHgTe epitaxial layers (4-6 μm) have been obtained by RF sputtering with localization of the mercury glow discharge in quasi-closed volume. The peculiarities of their condensation on CdTe substrates have been studied. The influence of technological parameters on the structural and electrophysical properties of MnCdHgTe layers has been investigated. The MnCdHgTe layers were chemically homogeneous in the surface of 2.5x2.5 CM~2 size. On the basis of the Hall measurements carried out in the magnetic field 0.1 T it has been shown that epitaxial MnCdHgTe layers obtained at the substrate temperatures in the region from 220 up to 250°C had p-type conductivity with the carrier concentration of about 10~(16)-10~(17) cm~(-3) the anomalously high values of the hole mobility (up to 1500 cm/Vs) at 77 K.
机译:通过RF溅射获得薄的MNCDHGGTE外延层(4-6μm),通过汞辉光放电的局部化以准闭合体积。研究了它们对CDTE基材的缩合的特性。研究了技术参数对MNCDHGTE层结构和电神法性质的影响。 MNCDHGTE层在2.5×2.5cm〜2的表面的表面上进行化学均匀。基于磁场中进行的霍尔测量值0.1t,已经证明,在220至250℃的区域的基板温度下获得的外延MNCDHGTE层具有p型导电性,载体浓度为约10 〜(16)-10〜(17)cm〜(-3)孔移动性的异常高值(高达1500cm / vs),77 k。

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