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Localized biexcitons in Al_xGa_(1-x)N ternary alloy epitaxial layers

机译:Al_xga_(1-x)n三元合金外延层的局部biexcitons

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Excitonic optical properties of Al_xGa_(1-x)N ternary alloy epitaxial layers have been studied by means of pho-toluminescence (PL), time-resolved PL, and PL excitation (PLE) spectroscopy. The luminescence line due to radiative recombination of biexcitons was clearly observed in an Al_(0.08)Ga_(0.92)N epitaxial layer. The PL decay time of excitons and biexcitons was estimated to be 350 and 210 ps, respectively. PLE spectroscopy of biexcitons enabled us to observe a two-photon absorption process of biexcitons. On the basis of the energy separation between exciton resonance and two-photon biexciton resonance, the binding energy of biexcitons in Al_(0.08)Ga_(0.92)N was estimated to be 15 +- 2 meV. This value was approximately 2.5 times as large as the binding energy of biexcitons in GaN. This value was also found to be comparable to the observed energy separation between the exciton luminescence and the biexciton luminescence, which indicated the strong localization of biexcitons.
机译:已经通过Pho-Toluminescence(PL),时间分辨PL和PL激励(PLE)光谱研究了AL_XGA_(1-X)N三元合金外延层的激发光学性质。在AL_(0.08)GA_(0.92)N外延层中清楚地观察到由于Biexcitons的辐射重组引起的发光线。激子和Biexcitons的Pl衰变时间分别估计为350和210 ps。 Biexcitons的PLE光谱使我们能够观察Biexcitons的双光子吸收过程。在激子共振和双光子Biexciton共振之间的能量分离的基础上,估计Al_(0.08)Ga_(0.92)N中Biexcitons的结合能量为15 + - 2meV。该值大约是GaN中Biexcitons的结合能量大约2.5倍。还发现该值与Exciton发光和Biexciton发光之间观察到的能量分离相当,这表明Biexcitons的强烈定位。

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