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Carbon nanotube field emission performance measured by insitu scanning electron microscopy

机译:通过Insitu扫描电子显微镜测量的碳纳米管场发射性能

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While many nanotube field emission properties can be computed to a good approximation by assuming the nanotube is a sharp graphite emitter, the reality of implementing nanotube field emitters in devices is more complex. The field emission current depends exponentially on nanotube diameter, nanotube height, geometrical placement, and nanotube orientation. These parameters are not well controlled in typical devices. Consequently, only a small fraction of a percent of available nanotubes contribute meaningful current, and more importantly, these nanotubes are so rare that they are not imaged in typical scanning electron microscope (SEM) and transmission electron microscope surveys of the emissive material. Many device properties are driven by the behavior at the individual nanotube level, and there is no reason to believe that the "average" nanotubes behave similar to the field-emitting minority. A detailed understanding of field emission behavior at the level of an individual emitter is important for producing good device designs.
机译:虽然通过假设纳米管是尖锐的石墨发射器,但是可以将许多纳米管场发射特性计算为良好的近似,但是在设备中实现纳米管场发射器的现实更复杂。现场发射电流呈指数呈纳米管直径,纳米管高度,几何放置和纳米管取向。这些参数在典型设备中不受很好地控制。因此,只有百分之一的可用纳米管贡献有意义的电流,更重要的是,这些纳米管是如此稀有的,即它们在典型的扫描电子显微镜(SEM)和发光材料的透射电子显微镜调查中不会成像。许多设备属性由单个纳米管级的行为驱动,并且没有理由相信“平均”纳米管的行为类似于场发射少数。对单个发射器级别的现场排放行为的详细了解对于生产良好的设备设计是重要的。

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