Image Contrast Enhancement In Field-emission Scanning Electron Microscopy Of Single-walled Carbon Nanotubes

摘要

The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO_2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO_2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO_2 substrates induced by the electron-beam irradiation.