Soft-switching performances of 1200V new punch-through IGBT using local lifetime control at high temperature

摘要

Soft-switching performances at high temperature of 1200V new planar punch-through IGBT using local lifetime control are evaluated and compared with conventional planar 1200V punch-through IGBT. Experimental investigations for ZVS and ZCS operating modes under various test conditions allow to establish comparative diagrams and graphs performances with conventional planar IGBT to give useful data for devices modeling, design and optimization.