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Mechanical behaviour of thin films on substrates: Debonding and buckling

机译:薄膜在基板上的力学行为:剥夺和屈曲

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In situ atomic force microscopy observations of nickel thin films on substrates under external compressive stresses have been carried out. Straight-sided wrinkles arise perpendicularly to the compression axis above a critical stress and undulations of very low amplitude also appear on these debonding regions. The dependence on stress of the shape of the wrinkles and of the undulations is discussed.
机译:已经进行了在外部压缩应力下衬底上镍薄膜的原位原子力显微镜观察。直侧皱纹垂直于压缩轴线以上临界应力,并且在这些剥离区域上也出现了非常低的幅度的波动。讨论了对皱纹形状和起伏的应力的依赖性。

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