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JACS-Pak/sup TM/ flip-chip chip scale package development and characterization

机译:JACS-PAK / SUP TM /倒装芯片芯片级封装开发和表征

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As the drive towards smaller portable communication products continues, conventional, peripheral leaded surface mount packaging technologies are beginning to reach their practical limits. Ongoing technology development and deployment activities in the area of direct chip attach and fine pitch ball grid array packaging have been underway within Motorola for the last decade. More recently, these two core competencies have been effectively leveraged leading to the development of a robust flip chip based Chip Scale Packaging technology dubbed JACS-Pak/sup TM/ CSP. The mix of technological capabilities that enabled this rapid development and qualification are discussed in this paper. To achieve the rapid deployment goal this program has used simulations extensively from the very onset of the program. A detailed cost modeling simulation identified the three major cost contributors to the overall package costs as wafer bumping costs, interposer substrate cost and manufacturing throughput. This focused the development effort on a low cost solution. Nonlinear finite element modeling and simulation was used at every stage of package development for design evaluation, design directions and design space determination. Finite element predictions at component level and board level were validated using micro moire laser interferometry for in-plane deformation measurement and Twyman-Green interferometry for out of plane deformation measurements. A detailed reliability testing program enabled confidence in the package performance and provided validation of the finite element based life time prediction capability.
机译:随着朝向更小的便携式通信产品的驱动,常规的外围铅表面贴装技术开始达到其实际限制。摩托罗拉在过去十年中,正在进行的技术开发和部署活动在直接芯片附着和细间距球栅格阵列包装中一直在进行中。最近,这两种核心竞争力得到了有效利用,导致开发基于强大的倒装芯片的芯片刻度包装技术称为JACS-PAK / SUP TM / CSP。本文讨论了实现这种快速发展和资格的技术能力的组合。为了实现快速部署目标,该程序从程序的起点广泛使用了模拟。详细的成本建模模拟确定了整个包装成本的三个主要成本贡献者,作为晶圆撞击成本,插入器基板成本和制造产量。这将开发工作集中在低成本的解决方案上。在设计评估,设计方向和设计空间确定的封装开发的每个阶段使用非线性有限元建模和仿真。使用微莫尔激光干涉法验证了组件水平和板级的有限元预测,用于面内变形测量和TWYMAN-绿色干涉测量,用于外平面变形测量。一个详细的可靠性测试程序使得对包性能的置信能力,并提供了基于有限元的寿命预测能力的验证。

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