Models for predicting the index of refraction of compounds at 193 and 589-nm

摘要

A simple empirical model is presented that predicts the index of refraction at 589 nm (D-line) and 193 nm for molecules based solely on chemical structure. The model was built by comparing literature values of refractive indices (sodium D-line 589 nm) of compounds with representative functionalities and has 18 adjustable parameters. Published values for nD and n_(193) were used to extrapolate the predictions from values of nD to values of n_(193). These simple, accessible models can be run using only Excel software on a laptop computer.