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Performance and reliability of a three-dimensional plastic moulded vertical multichip module (MCM-V)

机译:三维塑料模制垂直多芯片模块的性能和可靠性(MCM-V)

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The performance and reliability of a low-cost three-dimensional plastic moulded vertical multi-chip module concept is presented. Performance was evaluated using custom designed chips incorporating thermal, thermomechanical, electrical and reliability test structures. Results of performance are presented and are shown to correlate well with thermal, thermomechanical and electrical simulations. The thermal and thermomechanical performances are sufficient to allow use of the MCM-V technique in a wide range of applications without the need for special cooling techniques. Reliability testing to space level standards was carried out on 53 technology demonstrator modules incorporating the test chips and a high level of reliability has been demonstrated.
机译:提出了低成本三维塑料模制垂直多芯片模块概念的性能和可靠性。使用具有热,热机械,电气和可靠性测试结构的定制设计芯片进行评估性能。表现出性能结果,并显示出热,热机械和电气模拟良好。热和热机械性能足以允许在广泛的应用中使用MCM-V技术而无需特殊的冷却技术。对空间级标准的可靠性测试是在进行测试芯片的53种技术演示模块上进行的,并且已经证明了高水平的可靠性。

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