首页> 外文会议>Electronic Components and Technology Conference, 1995. Proceedings., 45th >Performance and reliability of a three-dimensional plastic moulded vertical multichip module (MCM-V)
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Performance and reliability of a three-dimensional plastic moulded vertical multichip module (MCM-V)

机译:三维塑料成型垂直多芯片模块(MCM-V)的性能和可靠性

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摘要

The performance and reliability of a low-cost three-dimensional plastic moulded vertical multi-chip module concept is presented. Performance was evaluated using custom designed chips incorporating thermal, thermomechanical, electrical and reliability test structures. Results of performance are presented and are shown to correlate well with thermal, thermomechanical and electrical simulations. The thermal and thermomechanical performances are sufficient to allow use of the MCM-V technique in a wide range of applications without the need for special cooling techniques. Reliability testing to space level standards was carried out on 53 technology demonstrator modules incorporating the test chips and a high level of reliability has been demonstrated.
机译:提出了一种低成本的三维塑料成型垂直多芯片模块概念的性能和可靠性。使用结合热,热机械,电气和可靠性测试结构的定制设计芯片来评估性能。给出了性能结果,并显示了与热,热机械和电仿真的相关性。热和热机械性能足以允许MCM-V技术在广泛的应用中使用,而无需特殊的冷却技术。在装有测试芯片的53个技术演示模块上进行了符合空间标准的可靠性测试,并证明了其高度的可靠性。

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